Mechanical-stress effect in the base-emitter voltage of integrated bipolar transistors

F Fruett, GCM Meijer

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationElectronics ET'2001: The tenth international scientific and applied science conference
Place of PublicationSofia
PublisherTechnical University Sofia
Pages95-98
Number of pages4
ISBN (Print)954-9518-17-5
Publication statusPublished - 2002
EventElectronics ET'2001, Sozopol, Bulgaria - Sofia, Bulgaria
Duration: 26 Sep 200128 Sep 2001

Publication series

Name
PublisherTechnical University - Sofia

Conference

ConferenceElectronics ET'2001, Sozopol, Bulgaria
Period26/09/0128/09/01

Keywords

  • Conf.proc. > 3 pag

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