@inproceedings{ac4245e63eab4cd3b7ea51492c02b39c,
title = "Mechanical-stress effect in the base-emitter voltage of integrated bipolar transistors",
keywords = "Conf.proc. > 3 pag",
author = "F Fruett and GCM Meijer",
note = "niet eerder opgevoerd; Electronics ET'2001, Sozopol, Bulgaria ; Conference date: 26-09-2001 Through 28-09-2001",
year = "2002",
language = "Undefined/Unknown",
isbn = "954-9518-17-5",
publisher = "Technical University Sofia",
pages = "95--98",
booktitle = "Electronics ET'2001: The tenth international scientific and applied science conference",
}