Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure measurements

KN van Dalen, GG Drijkoningen, DMJ Smeulders, HKJ Heller, C Glorieux, B Sarens, B Verstraeten

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)1299-1312
Number of pages14
JournalJournal of the Acoustical Society of America
Issue number3
Publication statusPublished - 2011


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  • CWTS 0.75 <= JFIS < 2.00

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