Memory fault modeling trends: a case study

S Hamdioui, R Wadsworth, J delos Reyes

Research output: Contribution to journalArticleScientificpeer-review

25 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)245-255
Number of pages11
JournalJournal of Electronic Testing: theory and applications
Volume20
Publication statusPublished - 2004

Keywords

  • academic journal papers
  • ZX CWTS JFIS < 1.00

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