Memory fault modeling trends: a case study

S Hamdioui, R Wadsworth, J delos Reyes

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	245-255
Number of pages	11
Journal	Journal of Electronic Testing: theory and applications
Volume	20
Publication status	Published - 2004

Keywords

@article{80148844669e4aa881fd6fcc0fed42ff,

title = "Memory fault modeling trends: a case study",

keywords = "academic journal papers, ZX CWTS JFIS < 1.00",

author = "S Hamdioui and R Wadsworth and {delos Reyes}, J",

year = "2004",

language = "Undefined/Unknown",

volume = "20",

pages = "245--255",

journal = "Journal of Electronic Testing: theory and applications",

issn = "0923-8174",

publisher = "Springer",

}