Memory profiling for intra-application data-communication quantification: A survey

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 10th International Design and Test Symposium
EditorsF Kurdahi, S Mir, MO Yu
Place of PublicationPiscataway
PublisherIEEE Society
Pages32-37
Number of pages6
ISBN (Print)978-1-4673-9993-4
DOIs
Publication statusPublished - 2015
EventIDT 2015: 10th International Design and Test Symposium - Amman, Jordan
Duration: 14 Dec 201516 Dec 2015
Conference number: 10

Publication series

Name
PublisherIEEE

Conference

ConferenceIDT 2015
CountryJordan
CityAmman
Period14/12/1516/12/15

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