Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs

IS Irobi, Z Al-Ars, S Hamdioui

Research output: Contribution to conferencePosterProfessional

2 Citations (Scopus)
Original languageEnglish
Publication statusPublished - 2011
Event2011 16th IEEE European Test Symposium (ETS2011) - Trondheim, Norway
Duration: 23 May 201127 May 2011

Other

Other2011 16th IEEE European Test Symposium (ETS2011)
Period23/05/1127/05/11

Bibliographical note

Gepubliceerd in Proceedings 16th IEEE European Test Symposium, page 205
IEEE, Los Alamitos, CA, USA

Keywords

  • Geen BTA classificatie

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