Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs

IS Irobi, Z Al-Ars, S Hamdioui

Research output: Contribution to conferencePosterProfessional

2 Citations (Scopus)
Original languageEnglish
Publication statusPublished - 2011
Event2011 16th IEEE European Test Symposium (ETS2011) - Trondheim, Norway
Duration: 23 May 201127 May 2011

Other

Other2011 16th IEEE European Test Symposium (ETS2011)
Period23/05/1127/05/11

Keywords

  • Geen BTA classificatie

Cite this

Irobi, IS., Al-Ars, Z., & Hamdioui, S. (2011). Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. Poster session presented at 2011 16th IEEE European Test Symposium (ETS2011), .