Memory testing with a RISC microcontroller

AJ van de Goor, GN Gaydadjiev, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

25 Citations (Scopus)
Original languageEnglish
Title of host publicationDesign, automation & test in Europe 2010
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE Society
Pages214-219
Number of pages6
ISBN (Print)978-3-9810801-6-2
Publication statusPublished - 2010
EventDATE 2010 - Piscataway
Duration: 8 Mar 201012 Mar 2010

Publication series

Name
PublisherIEEE

Conference

ConferenceDATE 2010
Period8/03/1012/03/10

Keywords

  • Conf.proc. > 3 pag

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