Method for determining a spring constant of an atomic force microscopy using coupling electrostatic pull-in instability and resonance frequency

H Sadeghian Marnani; F van Keulen

Method for determining a spring constant of an atomic force microscopy using coupling electrostatic pull-in instability and resonance frequency

H Sadeghian Marnani (Inventor), F van Keulen (Inventor)

Computational Design and Mechanics

Research output: Patent

Original language	English
Patent number	2009014
IPC	OCT-11-017
Priority date	17/12/13
Publication status	Published - 2013

Bibliographical note

OCT-11-017
Nog extern toevoegen op werkrelatie Keulen

Keywords

Geen VSNU-classificatie

Cite this

@misc{d2bfc9fd20bc405b80f38ddd736fea27,

title = "Method for determining a spring constant of an atomic force microscopy using coupling electrostatic pull-in instability and resonance frequency",

keywords = "Geen VSNU-classificatie",

author = "{Sadeghian Marnani}, H and {van Keulen}, F",

note = "OCT-11-017 Nog extern toevoegen op werkrelatie Keulen; 2009014; OCT-11-017",

year = "2013",

language = "English",

type = "Patent",

}