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Method for inspecting a specimen and charged particle multi-beam device
Pieter Kruit
(Inventor), Juergen Frosien (Inventor)
Research output
:
Patent
Overview
Research output
(1)
Research output
Research output per year
2018
2018
2018
1
Patent
Research output per year
Research output per year
1 results
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Title
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2018
Method for inspecting a specimen and charged particle multi-beam device
Kruit, P.
&
Frosien, J.
,
2018
, IPC No. H01J, Priority date
1 Dec 2016
, Priority No. WO 2018/099756
Research output
:
Patent