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Method for sample preparation for cryoelectron microscopy (CEM), microreactor and loading platform

HW Zandbergen (Inventor), CW Ahn (Inventor)

    Research output: Patent

    Original languageUndefined/Unknown
    Patent numberWO2008/010718
    IPCAanvrager: TU Delft
    Priority date24/01/08
    Publication statusPublished - 2008

    Bibliographical note

    Aanvrager: TU Delft

    Keywords

    • Octrooi

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