Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR

SWH Eijt, CV Falub, A van Veen, H Schut, PE Mijnarends

    Research output: Contribution to journalArticleScientificpeer-review

    6 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)234-238
    Number of pages5
    JournalApplied Surface Science
    Volume194
    Publication statusPublished - 2002

    Keywords

    • ZX CWTS JFIS < 1.00

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