Metric-DST: Mitigating Selection Bias Through Diversity-Guided Semi-Supervised Metric Learning

Y.I. Tepeli, M.J. de Wolf, Joana P. Gonçalves*

*Corresponding author for this work

Research output: Working paper/PreprintPreprint

Original languageEnglish
PublisherArXiv
DOIs
Publication statusPublished - 2024

Keywords

  • selection bias
  • metric learning
  • semi-supervised learning
  • diversity

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