TY - JOUR
T1 - Metrological intercomparison of six terrestrial laser scanning systems
AU - González-Jorge, Higinio
AU - Rodríguez-Gonzálvez, Pablo
AU - Shen, Yueqian
AU - Lagüela, Susana
AU - Díaz-Vilariño, Lucía
AU - Lindenbergh, Roderik
AU - González-Aguilera, Diego
AU - Arias, Pedro
PY - 2018/3/1
Y1 - 2018/3/1
N2 - Intercomparison among six terrestrial laser scanner systems focused on the measurement of small elements (< 0.5 m) is performed. Phase shift (PS) and time of flight (ToF) scanners are considered. Two standard artefacts containing threedimensional printing spheres and steps of variable height are used for the experiment. Results show errors between -4.5 and 3.5 mm in the measurement of distances between step planes. The most stable systems for measuring small elements seem the Leica C10, Faro Photon and Riegl LMS Z390i. The quality of the results is linked to the overall quality of the system rather than the specific technology used for range measurement (PS or ToF) which does not appear to be a determining factor.
AB - Intercomparison among six terrestrial laser scanner systems focused on the measurement of small elements (< 0.5 m) is performed. Phase shift (PS) and time of flight (ToF) scanners are considered. Two standard artefacts containing threedimensional printing spheres and steps of variable height are used for the experiment. Results show errors between -4.5 and 3.5 mm in the measurement of distances between step planes. The most stable systems for measuring small elements seem the Leica C10, Faro Photon and Riegl LMS Z390i. The quality of the results is linked to the overall quality of the system rather than the specific technology used for range measurement (PS or ToF) which does not appear to be a determining factor.
UR - http://www.scopus.com/inward/record.url?scp=85044076161&partnerID=8YFLogxK
U2 - 10.1049/iet-smt.2017.0209
DO - 10.1049/iet-smt.2017.0209
M3 - Article
SN - 1751-8822
VL - 12
SP - 218
EP - 222
JO - IET Science, Measurement and Technology
JF - IET Science, Measurement and Technology
IS - 2
ER -