Microscopic characterization of defect structure in RDX crystals

RHB Bouma, W. Duvalois, AEDM van der Heijden

Research output: Contribution to journalArticleScientificpeer-review

13 Citations (Scopus)
Original languageEnglish
Pages (from-to)263-274
Number of pages12
JournalJournal of Microscopy
Volume252
Issue number3
DOIs
Publication statusPublished - 2013

Keywords

  • CWTS 0.75 <= JFIS < 2.00

Cite this