Microscopic characterization of defect structure in RDX crystals

RHB Bouma, W. Duvalois, AEDM van der Heijden

Research output: Contribution to journal › Article › Scientific › peer-review

18 Citations (Scopus)

Keywords

@article{6e4e6701afbf4a1a9be804bbf8e39cf0,

title = "Microscopic characterization of defect structure in RDX crystals",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "RHB Bouma and W. Duvalois and {van der Heijden}, AEDM",

year = "2013",

doi = "10.1111/jmi.12088",

language = "English",

volume = "252",

pages = "263--274",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Blackwell",

number = "3",

}