Microstructural and electrical properties of resolidified submicron Al lines.

MJC van de Homberg

    Research output: ThesisDissertation (TU Delft)

    Original languageUndefined/Unknown
    QualificationDoctor of Philosophy
    Awarding Institution
    • Delft University of Technology
    • Radelaar, S, Supervisor
    • Alkemade, P.F.A., Advisor
    • Verbruggen, Ad, Advisor
    Award date1 Jan 1800
    Place of PublicationDelft
    Print ISBNs0040716234
    Publication statusPublished - 1998

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