Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process

D Danciu; R Ishihara; FD Tichelaar; Y Hiroshima; S Inoue; T Shimoda; JW Metselaar; CIM Beenakker

Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process

D Danciu, R Ishihara, FD Tichelaar, Y Hiroshima, S Inoue, T Shimoda, JW Metselaar, CIM Beenakker

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials
Editors	s.n.
Place of Publication	Tokyo, Japan
Publisher	Japan Society of Applied Physics
Pages	145-148
Number of pages	4
Publication status	Published - 2004
Event	2004 International workshop on active-matrix liquid0crystal displays - TFT technologies and related materials, Tokyo, Japan - Tokyo, Japan Duration: 25 Aug 2004 → 27 Aug 2004

Publication series

Name
Publisher	The Japan Society of Applied Physics

Conference

Conference	2004 International workshop on active-matrix liquid0crystal displays - TFT technologies and related materials, Tokyo, Japan
Period	25/08/04 → 27/08/04

Keywords

conference contrib. refereed
Conf.proc. > 3 pag

Cite this

Danciu, D., Ishihara, R., Tichelaar, FD., Hiroshima, Y., Inoue, S., Shimoda, T., Metselaar, JW., & Beenakker, CIM. (2004). Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process. In s.n. (Ed.), AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials (pp. 145-148). Japan Society of Applied Physics.

Danciu, D ; Ishihara, R ; Tichelaar, FD et al. / Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process. AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials. editor / s.n. Tokyo, Japan : Japan Society of Applied Physics, 2004. pp. 145-148

@inproceedings{8f3620647c384893b5e13749779d738d,

title = "Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "D Danciu and R Ishihara and FD Tichelaar and Y Hiroshima and S Inoue and T Shimoda and JW Metselaar and CIM Beenakker",

year = "2004",

language = "Undefined/Unknown",

publisher = "Japan Society of Applied Physics",

pages = "145--148",

editor = "s.n.",

booktitle = "AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials",

address = "Japan",

note = "2004 International workshop on active-matrix liquid0crystal displays - TFT technologies and related materials, Tokyo, Japan ; Conference date: 25-08-2004 Through 27-08-2004",

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Danciu, D, Ishihara, R , Tichelaar, FD, Hiroshima, Y, Inoue, S, Shimoda, T, Metselaar, JW & Beenakker, CIM 2004, Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process. in s.n. (ed.), AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials. Japan Society of Applied Physics, Tokyo, Japan, pp. 145-148, 2004 International workshop on active-matrix liquid0crystal displays - TFT technologies and related materials, Tokyo, Japan, 25/08/04.

Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process. / Danciu, D; Ishihara, R ; Tichelaar, FD et al.
AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials. ed. / s.n. Tokyo, Japan: Japan Society of Applied Physics, 2004. p. 145-148.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process

AU - Danciu, D

AU - Ishihara, R

AU - Tichelaar, FD

AU - Hiroshima, Y

AU - Inoue, S

AU - Shimoda, T

AU - Metselaar, JW

AU - Beenakker, CIM

PY - 2004

Y1 - 2004

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 145

EP - 148

BT - AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials

A2 - s.n., null

PB - Japan Society of Applied Physics

CY - Tokyo, Japan

T2 - 2004 International workshop on active-matrix liquid0crystal displays - TFT technologies and related materials, Tokyo, Japan

Y2 - 25 August 2004 through 27 August 2004

ER -

Danciu D, Ishihara R , Tichelaar FD, Hiroshima Y, Inoue S, Shimoda T et al. Microstructure characterisation of location-controlled Si-islands crystallised by excimer laser in the µ-Czochralski (grain filter) process. In s.n., editor, AM-LCD 04; International workshop on active-matrix liquid-crystal displays - TFT technologies and related materials. Tokyo, Japan: Japan Society of Applied Physics. 2004. p. 145-148