Microstructure characterization of location-controlled Si-islands crystallized by excimer laser in the mu-Czochralski (grain filter) process

R Ishihara, D Danciu, FD Tichelaar, M He, Y Hiroshima, S Inoue, T Shimoda, JW Metselaar, CIM Beenakker

Research output: Contribution to journalArticleScientific

19 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)316-321
Number of pages6
JournalJournal of Crystal Growth
Issue number2
Publication statusPublished - 2007


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