Microstructure of plasma deposited SiGe layers (1700, 1710, 1733).

FD Tichelaar, V Svetchnikov

    Research output: Book/ReportReportProfessional

    Original languageUndefined/Unknown
    Place of PublicationDelft
    PublisherDelft University of Technology
    Number of pages9
    Publication statusPublished - 2000

    Publication series

    Name
    PublisherTU Delft

    Bibliographical note

    19 TEM afdrukken.

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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