Minimal test for coupling faults in word-oriented memories

AJ van de Goor, MS Abadir, JF Carlin

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationDATE 02; Design, automation and test in Europe
EditorsC Delgado Kloos, J da Franca
Place of PublicationPiscataway, NJ, USA
PublisherIEEE
Pages944-948
Number of pages5
ISBN (Print)0-7695-1471-5
Publication statusPublished - 2002
EventDATE 02; Design, automation and test in Europe - Piscataway, NJ, USA
Duration: 4 Mar 20028 Mar 2002

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceDATE 02; Design, automation and test in Europe
Period4/03/028/03/02

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag
  • ZX Int.klas.verslagjaar < 2002

Cite this