Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers

Sasan Keyvani Janbahan, Hamed Sadeghian Marnani, Selman Tamer, Hans Goosen, Fred van Keulen

Research output: Contribution to journalArticleScientificpeer-review

19 Citations (Scopus)
159 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers'. Together they form a unique fingerprint.

INIS

Engineering

Material Science