Mitigation of Sense Amplifier Degradation Using Skewed Design

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

Designers typically add design margins to semiconductor memories to compensate for aging. However, the aging impact increases with technology downscaling, leading to the need for higher margins. This results into a negative impact on area, yield, performance, and power consumption. As an alternative, mitigation schemes can be developed to reduce such impact. This paper proposes a mitigation scheme for the memory's sense amplifier (SA); the scheme is based on creating a skew in the relative strengths of the SA's cross-coupled inverters during design. The skew is compensated by aging due to unbalanced workloads. As a result, the impact of aging on the SA is reduced. To validate the mitigation scheme, the degradation of the sense amplifier is analyzed for several workloads. The experimental results show that the proposed mitigation scheme reduces the degradation of the sense amplifier's critical figure-of-merit, the offset voltage, with up to 26%.

Original languageEnglish
Title of host publicationProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
EditorsGiorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1614-1617
Number of pages4
ISBN (Electronic)9783981926347
DOIs
Publication statusPublished - Mar 2020
Event2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 - Grenoble, France
Duration: 9 Mar 202013 Mar 2020

Publication series

NameProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020

Conference

Conference2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
CountryFrance
CityGrenoble
Period9/03/2013/03/20
OtherBecause of the COVID-19 outbreak, the conference took place in a virtual environment, in April and May 2020.

Keywords

  • aging
  • memory
  • mitigation
  • sense amplifier

Fingerprint Dive into the research topics of 'Mitigation of Sense Amplifier Degradation Using Skewed Design'. Together they form a unique fingerprint.

  • Cite this

    Kraak, D., Taouil, M., Hamdioui, S., Weckx, P., Cosemans, S., & Catthoor, F. (2020). Mitigation of Sense Amplifier Degradation Using Skewed Design. In G. Di Natale, C. Bolchini, & E-I. Vatajelu (Eds.), Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 (pp. 1614-1617). [9116532] (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.23919/DATE48585.2020.9116532