Moddeling and Measuring the reflection and transmission of a silicon wafer in the X- and Ka-Bands under illumination of light in a closed waveguide structure

M Hajian; SH Heijnen; FH Groen

Moddeling and Measuring the reflection and transmission of a silicon wafer in the X- and Ka-Bands under illumination of light in a closed waveguide structure

M Hajian, SH Heijnen, FH Groen

ImPhys/Optics

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	349-353
Number of pages	5
Journal	Microwave & Optical Technology Letters
Volume	31
Issue number	5
Publication status	Published - 2001

Keywords

ZX CWTS JFIS < 1.00

Cite this

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title = "Moddeling and Measuring the reflection and transmission of a silicon wafer in the X- and Ka-Bands under illumination of light in a closed waveguide structure",

keywords = "ZX CWTS JFIS < 1.00",

author = "M Hajian and SH Heijnen and FH Groen",

year = "2001",

language = "Undefined/Unknown",

volume = "31",

pages = "349--353",

journal = "Microwave & Optical Technology Letters",

issn = "0895-2477",

publisher = "John Wiley & Sons",

number = "5",

}

TY - JOUR

T1 - Moddeling and Measuring the reflection and transmission of a silicon wafer in the X- and Ka-Bands under illumination of light in a closed waveguide structure

AU - Hajian, M

AU - Heijnen, SH

AU - Groen, FH

PY - 2001

Y1 - 2001

KW - ZX CWTS JFIS < 1.00

M3 - Article

SN - 0895-2477

VL - 31

SP - 349

EP - 353

JO - Microwave & Optical Technology Letters

JF - Microwave & Optical Technology Letters

IS - 5

ER -