Moddeling and Measuring the reflection and transmission of a silicon wafer in the X- and Ka-Bands under illumination of light in a closed waveguide structure

M Hajian, SH Heijnen, FH Groen

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)349-353
Number of pages5
JournalMicrowave & Optical Technology Letters
Volume31
Issue number5
Publication statusPublished - 2001

Keywords

  • ZX CWTS JFIS < 1.00

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