Model-Based Diagnosis

J Pietersma, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationTangram: Model-based Integration and Testing of Complex High-Tech Systems
EditorsJ. Tretmans
Place of PublicationDen Dolech 2, 5612 AZ Eindhoven, Netherlands
PublisherEmbedded Systems Institute
Pages163-178
Number of pages16
ISBN (Print)978-90-78679-02-8
Publication statusPublished - 2007

Keywords

  • Boekdeel internat.wet

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