Model-based diagnosis for satellite-based instruments

A Bos, AJC van Gemund, C Witteveen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publication2000 IEEE autotestcon proceedings
Place of PublicationPiscataway
PublisherIEEE
Pages451-464
Number of pages14
ISBN (Print)0-7803-5868-6
Publication statusPublished - 2000
EventIEEE Systems Readiness Technology Conference, Anaheim - Piscataway
Duration: 18 Sep 200021 Sep 2000

Publication series

Name
PublisherIEEE Networking the World

Conference

ConferenceIEEE Systems Readiness Technology Conference, Anaheim
Period18/09/0021/09/00

Keywords

  • ZX Int.klas.verslagjaar < 2002

Cite this

Bos, A., van Gemund, AJC., & Witteveen, C. (2000). Model-based diagnosis for satellite-based instruments. In 2000 IEEE autotestcon proceedings (pp. 451-464). IEEE.