@inproceedings{d120472c256443558c1257a794626918,
title = "Model-based diagnosis for satellite-based instruments",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "A Bos and {van Gemund}, AJC and C Witteveen",
year = "2000",
language = "Undefined/Unknown",
isbn = "0-7803-5868-6",
publisher = "IEEE",
pages = "451--464",
booktitle = "2000 IEEE autotestcon proceedings",
address = "United States",
note = "IEEE Systems Readiness Technology Conference, Anaheim ; Conference date: 18-09-2000 Through 21-09-2000",
}