Model-based diagnosis for satellite-based instruments

A Bos, AJC van Gemund, C Witteveen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	2000 IEEE autotestcon proceedings
Place of Publication	Piscataway
Publisher	IEEE
Pages	451-464
Number of pages	14
ISBN (Print)	0-7803-5868-6
Publication status	Published - 2000
Event	IEEE Systems Readiness Technology Conference, Anaheim - Piscataway Duration: 18 Sep 2000 → 21 Sep 2000

Name
Publisher	IEEE Networking the World

Conference	IEEE Systems Readiness Technology Conference, Anaheim
Period	18/09/00 → 21/09/00

Cite this

Bos, A., van Gemund, AJC., & Witteveen, C. (2000). Model-based diagnosis for satellite-based instruments. In 2000 IEEE autotestcon proceedings (pp. 451-464). IEEE.

@inproceedings{d120472c256443558c1257a794626918,

title = "Model-based diagnosis for satellite-based instruments",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "A Bos and {van Gemund}, AJC and C Witteveen",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-7803-5868-6",

publisher = "IEEE",

pages = "451--464",

booktitle = "2000 IEEE autotestcon proceedings",

address = "United States",

note = "null ; Conference date: 18-09-2000 Through 21-09-2000",

}