Model based optical resolution

AJ den Dekker

Model based optical resolution

AJ den Dekker

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference
Place of Publication	New York
Publisher	Institute of Electrical and Electronic Engineers (IEEE)
Pages	441-446
Number of pages	6
Publication status	Published - 1996
Event	IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference, Brussels (BE) - New York Duration: 4 Jun 1996 → 6 Jun 1996

Publication series

Name
Publisher	The Institute of Electrical and Electronics Engineers

Conference

Conference	IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference, Brussels (BE)
Period	4/06/96 → 6/06/96

Cite this

@inproceedings{5d5c0f433de442669e59a8e3344c33ff,

title = "Model based optical resolution",

author = "{den Dekker}, AJ",

year = "1996",

language = "Undefined/Unknown",

publisher = "Institute of Electrical and Electronic Engineers (IEEE)",

pages = "441--446",

booktitle = "Proceedings of IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference",

note = "IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference, Brussels (BE) ; Conference date: 04-06-1996 Through 06-06-1996",

}

den Dekker, AJ 1996, Model based optical resolution. in Proceedings of IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference. Institute of Electrical and Electronic Engineers (IEEE), New York, pp. 441-446, IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference, Brussels (BE), 4/06/96.

TY - GEN

T1 - Model based optical resolution

AU - den Dekker, AJ

PY - 1996

Y1 - 1996

M3 - Conference contribution

SP - 441

EP - 446

BT - Proceedings of IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference

PB - Institute of Electrical and Electronic Engineers (IEEE)

CY - New York

T2 - IMTC'96, The Joint IEEE Instrumentation and Measurement Technology Conference and IMEKO TC-7 Conference, Brussels (BE)

Y2 - 4 June 1996 through 6 June 1996

ER -