Modeling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure.

M Hajian, SH Heijnen, FH Groen, P Hakkert, LP Ligthart

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)349-353
Number of pages5
JournalMicrowave & Optical Technology Letters
Issue number5
Publication statusPublished - 2001


  • ZX Int.klas.verslagjaar < 2002

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