Modeling and Mitigating NBTI in Nanoscale Circuits

MSK Seyab, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

24 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of IEEE International On-Line Testing Symposium (IOLTS 2011)
EditorsM Nicolaidis, A Paschalis, D Gizopoulos, X Vera
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages3-8
Number of pages6
ISBN (Print)978-1-4577-1054-4
DOIs
Publication statusPublished - 2011
EventIOLTS 2011 - Piscataway, NJ, USA
Duration: 13 Jul 201115 Jul 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceIOLTS 2011
Period13/07/1115/07/11

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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