Modeling and Mitigating NBTI in Nanoscale Circuits

MSK Seyab; S Hamdioui

doi:10.1109/IOLTS.2011.5993802

Modeling and Mitigating NBTI in Nanoscale Circuits

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

24 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of IEEE International On-Line Testing Symposium (IOLTS 2011)
Editors	M Nicolaidis, A Paschalis, D Gizopoulos, X Vera
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	3-8
Number of pages	6
ISBN (Print)	978-1-4577-1054-4
DOIs	https://doi.org/10.1109/IOLTS.2011.5993802
Publication status	Published - 2011
Event	IOLTS 2011 - Piscataway, NJ, USA Duration: 13 Jul 2011 → 15 Jul 2011

Publication series

Name
Publisher	IEEE

Conference

Conference	IOLTS 2011
Period	13/07/11 → 15/07/11

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag

Access to Document

10.1109/IOLTS.2011.5993802

Cite this

@inproceedings{117e6963c2284793bc41883fd8ced860,

title = "Modeling and Mitigating NBTI in Nanoscale Circuits",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "MSK Seyab and S Hamdioui",

year = "2011",

doi = "10.1109/IOLTS.2011.5993802",

language = "English",

isbn = "978-1-4577-1054-4",

publisher = "IEEE",

pages = "3--8",

editor = "M Nicolaidis and A Paschalis and D Gizopoulos and X Vera",

booktitle = "Proceedings of IEEE International On-Line Testing Symposium (IOLTS 2011)",

address = "United States",

note = "IOLTS 2011 ; Conference date: 13-07-2011 Through 15-07-2011",

}

Modeling and Mitigating NBTI in Nanoscale Circuits. / Seyab, MSK; Hamdioui, S.
Proceedings of IEEE International On-Line Testing Symposium (IOLTS 2011). ed. / M Nicolaidis; A Paschalis; D Gizopoulos; X Vera. Piscataway, NJ, USA: IEEE, 2011. p. 3-8.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Modeling and Mitigating NBTI in Nanoscale Circuits

AU - Seyab, MSK

AU - Hamdioui, S

PY - 2011

Y1 - 2011

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

U2 - 10.1109/IOLTS.2011.5993802

DO - 10.1109/IOLTS.2011.5993802

M3 - Conference contribution

SN - 978-1-4577-1054-4

SP - 3

EP - 8

BT - Proceedings of IEEE International On-Line Testing Symposium (IOLTS 2011)

A2 - Nicolaidis, M

A2 - Paschalis, A

A2 - Gizopoulos, D

A2 - Vera, X

PB - IEEE

CY - Piscataway, NJ, USA

T2 - IOLTS 2011

Y2 - 13 July 2011 through 15 July 2011

ER -