Modeling of particle imaging through shock waves.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of Optical Engineering and Instrumentation, SPIE Annual Meeting, Paper 5867-22
Place of Publication	San Diego, California, USA
Publisher	SPIE
Pages	-
Publication status	Published - 2005

Name
Publisher	SPIE

Keywords

@inproceedings{4f4ff146065745ad8081b05ed5ff3dc3,

title = "Modeling of particle imaging through shock waves.",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "GE Elsinga and {van Oudheusden}, BW and F Scarano",

year = "2005",

language = "Undefined/Unknown",

publisher = "SPIE",

pages = "--",

booktitle = "Proceedings of Optical Engineering and Instrumentation, SPIE Annual Meeting, Paper 5867-22",

address = "United States",

}

TY - GEN

T1 - Modeling of particle imaging through shock waves.

AU - Elsinga, GE

AU - van Oudheusden, BW

AU - Scarano, F

PY - 2005

Y1 - 2005

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - -

BT - Proceedings of Optical Engineering and Instrumentation, SPIE Annual Meeting, Paper 5867-22

PB - SPIE

CY - San Diego, California, USA

ER -