Modeling of spectral response measurements on two-terminal multi-junction solar cells

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

Accurate measurements on the spectral response of two-terminal multi-junction solar cells demand the application of appropriate bias light and bias voltage. Typically, fine-tuning the bias condition is a time- and effort-consuming process. In this work, a model with realistic input was developed for simulating the spectral response of multi-junction solar cells obtained in certain measurement conditions. As such spectral response can be anticipated in the measurement with the assigned opto-electrical bias configuration, the model expedites the process of finding the optimal bias condition, as well as the understanding of the causes of measurement artifacts. The model can be further extended to simulate the devices made with different PV technologies, so it facilitates the reliable characterization of novel multi-junction architectures.
Original languageEnglish
Title of host publication43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1594-1599
Number of pages5
ISBN (Electronic)978-1-5090-2724-8
DOIs
Publication statusPublished - 21 Nov 2016
EventPVSC 2016: 43rd IEEE Photovoltaic Specialists Conference - Portland, OR, United States
Duration: 5 Jun 201610 Jun 2016
Conference number: 43
http://www.ieee-pvsc.org/PVSC44/

Conference

ConferencePVSC 2016
Abbreviated titlePVSC 2016
CountryUnited States
CityPortland, OR
Period5/06/1610/06/16
Internet address

Keywords

  • measurement artifacts
  • multi-junction solar cells
  • spectral response measurements
  • EQE

Fingerprint

Dive into the research topics of 'Modeling of spectral response measurements on two-terminal multi-junction solar cells'. Together they form a unique fingerprint.

Cite this