Abstract
Accurate measurements on the spectral response of two-terminal multi-junction solar cells demand the application of appropriate bias light and bias voltage. Typically, fine-tuning the bias condition is a time- and effort-consuming process. In this work, a model with realistic input was developed for simulating the spectral response of multi-junction solar cells obtained in certain measurement conditions. As such spectral response can be anticipated in the measurement with the assigned opto-electrical bias configuration, the model expedites the process of finding the optimal bias condition, as well as the understanding of the causes of measurement artifacts. The model can be further extended to simulate the devices made with different PV technologies, so it facilitates the reliable characterization of novel multi-junction architectures.
Original language | English |
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Title of host publication | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 1594-1599 |
Number of pages | 5 |
ISBN (Electronic) | 978-1-5090-2724-8 |
DOIs | |
Publication status | Published - 21 Nov 2016 |
Event | PVSC 2016: 43rd IEEE Photovoltaic Specialists Conference - Portland, OR, United States Duration: 5 Jun 2016 → 10 Jun 2016 Conference number: 43 http://www.ieee-pvsc.org/PVSC44/ |
Conference
Conference | PVSC 2016 |
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Abbreviated title | PVSC 2016 |
Country/Territory | United States |
City | Portland, OR |
Period | 5/06/16 → 10/06/16 |
Internet address |
Keywords
- measurement artifacts
- multi-junction solar cells
- spectral response measurements
- EQE