Abstract
Thermal analysis plays a crucial role in designing and reliability of contemporary semiconductor devices. In this paper, the analogy between the electrical and thermal systems is extended for analysis of nonlinear two dimensional hyperbolic heat conduction (HHC) in Silicon-On-Insulator (SOI) transistor. The equivalent Resistance-Inductance-Capacitance(RLC) transmission line network is solved fast and easily by an electric solver tool such as HSPICE. The influence of a temperature dependent thermal conductivity and relaxation time in temperature distribution is discussed. The results demonstrate the wave character phenomena of the heat propagation that is occurring in nano-scaled high frequency electronic devices.
Original language | English |
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Title of host publication | 2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018 |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 1-5 |
Number of pages | 5 |
ISBN (Electronic) | 978-1-5386-2359-6 |
DOIs | |
Publication status | Published - 2018 |
Event | EuroSimE 2018: 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Toulouse, France Duration: 15 Apr 2018 → 18 Apr 2018 |
Conference
Conference | EuroSimE 2018 |
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Abbreviated title | EuroSimE 2018 |
Country/Territory | France |
City | Toulouse |
Period | 15/04/18 → 18/04/18 |
Keywords
- Heating systems
- Mathematical model
- Conductivity
- Nanoscale devices
- Heat transfer
- Transistors