Modeling Soft-Error Reliability Under Variability

Aneesh Balakrishnan, G. Cardoso Medeiros, Cemil Cem Gursoy, S. Hamdioui, Maksim Jenihhin, Dan Alexandrescu

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Abstract

The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in deep submicron technologies are characterized as the major critical issues of high-performance integrated circuits. The previous scientific research studies provide a comprehensive description that the soft-error vulnerability becomes more severe as the circuit performance degrades with aging. The main reason is the reduction of cell-level critical charge in an aging environment. However, such increased soft-error generation does not necessarily contribute towards circuits' critical functional failures. The proposal of this paper is the experimental investigation of soft error propagation at the aged gate-level by considering the different derating factors like Electrical Derating (EDR), Temporal Derating (TDR), Logical Derating (LDR), and Functional Derating (FDR). As contrary to the previous studies, the results of this work prove that SEU fault propagation probability is reducing in critical paths as time advances while the propagation probability of SET faults is neither reducing nor increasing, but the spot of generation of failure enhancing SETs is shifting within the clock period.
Original languageEnglish
Title of host publication34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
PublisherIEEE
Pages1-6
Number of pages6
ISBN (Electronic)978-1-6654-1609-2
DOIs
Publication statusPublished - 2021
Event34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Online, Athens, Greece
Duration: 6 Oct 20218 Oct 2021
Conference number: 34
http://www.dfts.org/

Conference

Conference34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Abbreviated titleDFT 2021
Country/TerritoryGreece
CityAthens
Period6/10/218/10/21
Internet address

Keywords

  • NBTI
  • Standard Delay Format
  • Single Event Upset
  • Single Event Transient

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  • DFT'21 Outstanding Student Paper

    Balakrishnan, A. (Recipient), Cardoso Medeiros, G. (Recipient), Cem Gursoy, C. (Recipient), Hamdioui, S. (Recipient), Jenihhin, M. (Recipient) & Alexandrescu, D. (Recipient), 9 Oct 2021

    Prize: Prize (including medals and awards)

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