Modeling techniques and tests for partial faults in memory devices

Z Al-Ars; AJ van de Goor

Modeling techniques and tests for partial faults in memory devices

Z Al-Ars, AJ van de Goor

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	DATE'02: Design, automation and test in Europe; Proceedings
Editors	C Delgado Kloos, J da Franca
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	89-94
Number of pages	6
ISBN (Print)	0-7695-1471-5
Publication status	Published - 2002
Event	DATE'02 - Piscataway, NJ, USA Duration: 4 Mar 2002 → 8 Mar 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	DATE'02
Period	4/03/02 → 8/03/02

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
ZX Nader te bep. ivm conversie
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{b6950672c2e74cf8b68a68009c9450b1,

title = "Modeling techniques and tests for partial faults in memory devices",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, ZX Nader te bep. ivm conversie, ZX Int.klas.verslagjaar < 2002",

author = "Z Al-Ars and {van de Goor}, AJ",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7695-1471-5",

publisher = "IEEE Society",

pages = "89--94",

editor = "{Delgado Kloos}, C and {da Franca}, J",

booktitle = "DATE'02: Design, automation and test in Europe; Proceedings",

note = "DATE'02 ; Conference date: 04-03-2002 Through 08-03-2002",

}

Modeling techniques and tests for partial faults in memory devices. / Al-Ars, Z; van de Goor, AJ.
DATE'02: Design, automation and test in Europe; Proceedings. ed. / C Delgado Kloos; J da Franca. Piscataway, NJ, USA: IEEE Society, 2002. p. 89-94.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Modeling techniques and tests for partial faults in memory devices

AU - Al-Ars, Z

AU - van de Goor, AJ

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - ZX Nader te bep. ivm conversie

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-1471-5

SP - 89

EP - 94

BT - DATE'02: Design, automation and test in Europe; Proceedings

A2 - Delgado Kloos, C

A2 - da Franca, J

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - DATE'02

Y2 - 4 March 2002 through 8 March 2002

ER -