Modeling the effect of wave-front aberrations in fiber-based scanning optical microscopy

HRGW Verstraete, M Verhaegen, J Kalkman

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings Imaging and Applied Optics - Applied Industrial Optics: Spectroscopy, Imaging and Metrology 2013
EditorsJ Christou, D Miller
Place of PublicationChicago, USA
PublisherOSA Publishing
Pages1-3
Number of pages3
ISBN (Print)978-1-55752-975-6
DOIs
Publication statusPublished - 2013
EventApplied Industrial Optics: Spectroscopy, Imaging and Metrology-2013, Arlington, Virginia, USA - Chicago, USA
Duration: 23 Jun 201327 Jun 2013

Publication series

Name
PublisherOSA Publishing

Conference

ConferenceApplied Industrial Optics: Spectroscopy, Imaging and Metrology-2013, Arlington, Virginia, USA
Period23/06/1327/06/13

Keywords

  • Conf.proc. > 3 pag

Cite this