Molecular dynamics simulation of silicon sputtering: sensitivity to the choice of potential

BJ Thijsse, TPC Klaver, EFC Haddeman

    Research output: Contribution to journalArticleScientificpeer-review

    23 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)29-38
    Number of pages10
    JournalApplied Surface Science
    Volume231-232
    Publication statusPublished - 2004

    Keywords

    • ZX CWTS JFIS < 1.00

    Cite this