Multi-attribute analysisi of 4D anomalies using pattern recognition technology

T Oldenziel, P Meldahl, H Ligtenberg, P Digranes, LK Stronen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proc. 72nd SEG conference, Salt Lake City, USA
Pages	1766-1769
Number of pages	4
Publication status	Published - 2002

Nog niet eerder opgevoerd

Keywords

@inproceedings{16bf351d6c354398bc2f566589b595b1,

title = "Multi-attribute analysisi of 4D anomalies using pattern recognition technology",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "T Oldenziel and P Meldahl and H Ligtenberg and P Digranes and LK Stronen",

note = "Nog niet eerder opgevoerd",

year = "2002",

language = "Undefined/Unknown",

pages = "1766--1769",

booktitle = "Proc. 72nd SEG conference, Salt Lake City, USA",

}

TY - GEN

T1 - Multi-attribute analysisi of 4D anomalies using pattern recognition technology

AU - Oldenziel, T

AU - Meldahl, P

AU - Ligtenberg, H

AU - Digranes, P

AU - Stronen, LK

N1 - Nog niet eerder opgevoerd

PY - 2002

Y1 - 2002

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 1766

EP - 1769

BT - Proc. 72nd SEG conference, Salt Lake City, USA

ER -