Multi-attribute analysisi of 4D anomalies using pattern recognition technology

T Oldenziel, P Meldahl, H Ligtenberg, P Digranes, LK Stronen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProc. 72nd SEG conference, Salt Lake City, USA
    Pages1766-1769
    Number of pages4
    Publication statusPublished - 2002

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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