Multi-attribute analysisi of 4D anomalies using pattern recognition technology

T Oldenziel, P Meldahl, H Ligtenberg, P Digranes, LK Stronen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProc. 72nd SEG conference, Salt Lake City, USA
    Number of pages4
    Publication statusPublished - 2002

    Bibliographical note

    Nog niet eerder opgevoerd


    • conference contrib. refereed
    • Conf.proc. > 3 pag

    Cite this