Multi-attribute analysisi of 4D anomalies using pattern recognition technology

T Oldenziel, P Meldahl, H Ligtenberg, P Digranes, LK Stronen

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProc. 72nd SEG conference, Salt Lake City, USA
    Pages1766-1769
    Number of pages4
    Publication statusPublished - 2002

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

    Cite this

    Oldenziel, T., Meldahl, P., Ligtenberg, H., Digranes, P., & Stronen, LK. (2002). Multi-attribute analysisi of 4D anomalies using pattern recognition technology. In Proc. 72nd SEG conference, Salt Lake City, USA (pp. 1766-1769)