Multi-class Linear Feature Extraction by Nonlinear PCA.

RPW Duin, M Loog, R Haeb-Umbach

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    8 Citations (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationICPR15, Proc. 15th Int. Conference on Pattern Recognition
    EditorsA Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, AK Jain, J Kittler
    Place of PublicationLos Alamitos
    PublisherIEEE
    Pages398-401
    Number of pages4
    ISBN (Print)0-7695-0750-6
    Publication statusPublished - 2000
    EventBarcelona, Spain - Los Alamitos
    Duration: 3 Sep 20007 Sep 2000

    Publication series

    Name
    PublisherIEEE Computer Society Press
    NameInternational Conference on Pattern Recognition
    Volume2
    ISSN (Print)1051-4651

    Conference

    ConferenceBarcelona, Spain
    Period3/09/007/09/00

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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