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Multi electron beam inspection apparatus
Pieter Kruit
(Inventor)
Research output
:
Patent
Overview
Research output
(1)
Research output
Research output per year
2016
2016
2016
1
Patent
Research output per year
Research output per year
1 results
Publication Year, Title
(descending)
Publication Year, Title
(ascending)
Title
Type
Search results
2016
Multi electron beam inspection apparatus
Kruit, P.
,
2016
, IPC No. H01J, Priority date
4 Sept 2014
, Priority No. WO2016/036246
Research output
:
Patent