Multi-physics simulation and reliability analysis for LED luminaires under step stress accelerated degradation test

H Tang, DG Yang, GQ Zhang, F Hou, M Cai, Z Cui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

15 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
EditorsO De Saint Leger et al
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages491-495
Number of pages5
ISBN (Print)978-1-4673-1512-8
DOIs
Publication statusPublished - 2012
EventEuroSimE 2012: 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Lisbon, Portugal
Duration: 16 Apr 201218 Apr 2012
Conference number: 13

Publication series

Name
PublisherIEEE

Conference

ConferenceEuroSimE 2012
Country/TerritoryPortugal
CityLisbon
Period16/04/1218/04/12

Bibliographical note

Harvest
Article number: 6191774

Cite this