Multiangle processing and multiscale characterization of walkaway VSP data.

JCM Goudswaard, MWP Dillen, CPA Wapenaar

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    1 Citation (Scopus)
    Original languageUndefined/Unknown
    Title of host publicationExtended abstracts of the 70th annual SEG meeting
    Number of pages4
    Publication statusPublished - 2000

    Bibliographical note

    ISSN: 1052-3812


    • ZX Int.klas.verslagjaar < 2002

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