Multiple elimination and transmission compensation in primary reflections in data domain

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Abstract

We retrieve transmission compensated subsurface primary reflections from the reflection response measured at the surface. This is achieved by filtering the reflection response. The application of this scheme does not require model information. In this process, the reflection response is convolved and correlated with itself. The result after each convolution and correlation is truncated in the time domain. Free-surface and internal multiple reflections are removed and the two-way transmission effects in the primary reflections are compensated for in one step. The output of this scheme is a data set that contains only transmission compensated primary reflections. The obtained data set can be used as input to retrieve an artefact-free image of the medium. We illustrate the method with a two-dimensional example that shows how free-surface and internal multiple reflections are removed and transmission loss in primary reflections are compensated for. The method can have a wide range of applications in 3D strongly scattering media that are accessible from one side only.
Original languageEnglish
Title of host publicationSEG Technical Program Expanded Abstracts 2018
Subtitle of host publication14-19 October 2018, Anaheim, United States
PublisherSEG
Pages5445-5448
DOIs
Publication statusPublished - 2018
EventSEG Annual Meeting 2018 - Anaheim convention Center, Anaheim, United States
Duration: 14 Oct 201819 Oct 2018
Conference number: 88
https://seg.org/Annual-Meeting-2018

Publication series

NameSEG Technical Program Expanded Abstracts 2018
PublisherSEG
ISSN (Electronic)1949-4645

Other

OtherSEG Annual Meeting 2018
Abbreviated titleSEG 2018
CountryUnited States
CityAnaheim
Period14/10/1819/10/18
Internet address

Keywords

  • reflection
  • 3D
  • scattering

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    Zhang, L., & Slob, E. (2018). Multiple elimination and transmission compensation in primary reflections in data domain. In SEG Technical Program Expanded Abstracts 2018: 14-19 October 2018, Anaheim, United States (pp. 5445-5448). (SEG Technical Program Expanded Abstracts 2018). SEG. https://doi.org/10.1190/segam2018-w4-01.1