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Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films
Roland Resel*, Markus Bainschab, Alexander Pichler, Theo DIngemans, Clemens Simbrunner, Julian Stangl, Ingo Salzmann
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
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