Multiple scattering in grazing-incidence X-ray diffraction: Impact on lattice-constant determination in thin films

Roland Resel, Markus Bainschab, Alexander Pichler, Theo DIngemans, Clemens Simbrunner, Julian Stangl, Ingo Salzmann

Research output: Contribution to journalArticleScientificpeer-review

18 Citations (Scopus)
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