Nanocrystal size distribution analysis from transmission electron microscopy images

M van Sebille, LJP van der Maaten, L Xie, K Jarolimek, R Santbergen, RACMM van Swaaij, Klaus Leifer, M Zeman

Research output: Contribution to journalArticleScientificpeer-review

5 Citations (Scopus)


We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.
Original languageEnglish
Pages (from-to)20593-20606
Number of pages14
Issue number48
Publication statusPublished - 2015


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