Nanofabricated tips for device-based and double-tip scanning tunneling microscopy

Maarten Leeuwenhoek

Research output: ThesisDissertation (TU Delft)

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Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Groeblacher, S., Supervisor
  • Allan, Milan P., Advisor, External person
Award date20 Feb 2020
Print ISBNs978-90-8593-432-5
DOIs
Publication statusPublished - 2020

Keywords

  • double tip
  • two probe
  • scanning tunneling microscope
  • local gate
  • nanofabrication
  • quantum materials

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