Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis.

LR van den Doel; LJ van Vliet; KT Hjelt; MJ Vellekoop; F Gromball; JG Korvink; IT Young

Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis.

LR van den Doel, LJ van Vliet, KT Hjelt, MJ Vellekoop, F Gromball, JG Korvink, IT Young

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ICPR15, Proc. 15th Int. Conference on Pattern Recognition
Editors	A Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, T Huang, J Serra
Place of Publication	Los Alamitos
Publisher	IEEE
Pages	57-62
Number of pages	6
ISBN (Print)	0-7695-0750-6
Publication status	Published - 2000
Event	Barcelona, Spain - Los Alamitos Duration: 3 Sept 2000 → 7 Sept 2000

Publication series

Name
Publisher	IEEE Computer Society Press

Name	International Conference on Pattern Recognition
Volume	3
ISSN (Print)	1051-4651

Conference

Conference	Barcelona, Spain
Period	3/09/00 → 7/09/00

Bibliographical note

ISSN: 1051-4651

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

van den Doel, LR., van Vliet, LJ., Hjelt, KT., Vellekoop, MJ., Gromball, F., Korvink, JG., & Young, IT. (2000). Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis. In A. Sanfeliu, JJ. Villanueva, M. Vanrell, R. Alquezar, T. Huang, & J. Serra (Eds.), ICPR15, Proc. 15th Int. Conference on Pattern Recognition (pp. 57-62). (International Conference on Pattern Recognition; Vol. 3). IEEE.

van den Doel, LR ; van Vliet, LJ ; Hjelt, KT et al. / Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis. ICPR15, Proc. 15th Int. Conference on Pattern Recognition. editor / A Sanfeliu ; JJ Villanueva ; M Vanrell ; R Alquezar ; T Huang ; J Serra. Los Alamitos : IEEE, 2000. pp. 57-62 (International Conference on Pattern Recognition).

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title = "Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis.",

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author = "{van den Doel}, LR and {van Vliet}, LJ and KT Hjelt and MJ Vellekoop and F Gromball and JG Korvink and IT Young",

note = "ISSN: 1051-4651; Barcelona, Spain ; Conference date: 03-09-2000 Through 07-09-2000",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-7695-0750-6",

publisher = "IEEE",

pages = "57--62",

editor = "A Sanfeliu and JJ Villanueva and M Vanrell and R Alquezar and T Huang and J Serra",

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van den Doel, LR, van Vliet, LJ, Hjelt, KT, Vellekoop, MJ, Gromball, F, Korvink, JG & Young, IT 2000, Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis. in A Sanfeliu, JJ Villanueva, M Vanrell, R Alquezar, T Huang & J Serra (eds), ICPR15, Proc. 15th Int. Conference on Pattern Recognition. International Conference on Pattern Recognition, vol. 3, IEEE, Los Alamitos, pp. 57-62, Barcelona, Spain, 3/09/00.

Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis. / van den Doel, LR; van Vliet, LJ; Hjelt, KT et al.
ICPR15, Proc. 15th Int. Conference on Pattern Recognition. ed. / A Sanfeliu; JJ Villanueva; M Vanrell; R Alquezar; T Huang; J Serra. Los Alamitos: IEEE, 2000. p. 57-62 (International Conference on Pattern Recognition; Vol. 3).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis.

AU - van den Doel, LR

AU - van Vliet, LJ

AU - Hjelt, KT

AU - Vellekoop, MJ

AU - Gromball, F

AU - Korvink, JG

AU - Young, IT

N1 - ISSN: 1051-4651

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-0750-6

SP - 57

EP - 62

BT - ICPR15, Proc. 15th Int. Conference on Pattern Recognition

A2 - Sanfeliu, A

A2 - Villanueva, JJ

A2 - Vanrell, M

A2 - Alquezar, R

A2 - Huang, T

A2 - Serra, J

PB - IEEE

CY - Los Alamitos

T2 - Barcelona, Spain

Y2 - 3 September 2000 through 7 September 2000

ER -

van den Doel LR, van Vliet LJ, Hjelt KT, Vellekoop MJ, Gromball F, Korvink JG et al. Nanometer-Scale Height Measurements in Micromachined Picoliter Vials based on Interference Fringe Analysis. In Sanfeliu A, Villanueva JJ, Vanrell M, Alquezar R, Huang T, Serra J, editors, ICPR15, Proc. 15th Int. Conference on Pattern Recognition. Los Alamitos: IEEE. 2000. p. 57-62. (International Conference on Pattern Recognition).