NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of 3rd Workshop on Design for Reliability (DFR'11)
Editors	A Orailoglu, MK Michael, Y Sazeides, T Theocharides
Place of Publication	Crete, Greece
Publisher	HiPEAC
Pages	1-10
Number of pages	10
ISBN (Print)	978-1-4503-0241-8
Publication status	Published - 2011
Event	DFR'11 - Crete, Greece Duration: 23 Jan 2011 → 23 Jan 2011

Name
Publisher	HiPEAC

Conference	DFR'11
Period	23/01/11 → 23/01/11

Keywords

@inproceedings{024de95c28174d948c16ccf8d025ef1d,

title = "NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation",

keywords = "Conf.proc. > 3 pag",

author = "MSK Seyab and S Hamdioui",

year = "2011",

language = "English",

isbn = "978-1-4503-0241-8",

publisher = "HiPEAC",

pages = "1--10",

editor = "A Orailoglu and MK Michael and Y Sazeides and T Theocharides",

booktitle = "Proceedings of 3rd Workshop on Design for Reliability (DFR'11)",

note = "DFR'11 ; Conference date: 23-01-2011 Through 23-01-2011",

}

NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation. / Seyab, MSK; Hamdioui, S.
Proceedings of 3rd Workshop on Design for Reliability (DFR'11). ed. / A Orailoglu; MK Michael; Y Sazeides; T Theocharides. Crete, Greece: HiPEAC, 2011. p. 1-10.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation

AU - Seyab, MSK

AU - Hamdioui, S

PY - 2011

Y1 - 2011

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4503-0241-8

SP - 1

EP - 10

BT - Proceedings of 3rd Workshop on Design for Reliability (DFR'11)

A2 - Orailoglu, A

A2 - Michael, MK

A2 - Sazeides, Y

A2 - Theocharides, T

PB - HiPEAC

CY - Crete, Greece

T2 - DFR'11

Y2 - 23 January 2011 through 23 January 2011

ER -