New method for probe position correction for Ptychography

P. Dwivedi, A. P. Konijnenberg, S. F. Pereira, H. P. Urbach

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)
29 Downloads (Pure)


For high resolution imaging, X-rays and electron beams are being used. However, for such a short wavelength, imaging with lenses becomes difficult as lenses absorb a part of radiation and lenses with very low aberrations must be used. Ptychography is a lens-less imaging technique which uses intensity information of the multiple diffraction patterns in the far field. These multiple far field diffraction patterns are generated by an unknown object which is scanned by a localized illuminated spot (probe). Accurate knowledge of initial parameters is important for a good reconstruction of the object. Robustness of the Ptychography Iterative Engine (PIE) has already been studied for inaccurately known initial parameters, where the success of the algorithm was found to be sensitive to the accuracy of the estimate of lateral positions of the probe.:; We present here a new method to correct the lateral position of the probe with respect to the object. This method is more straightforward to implement than other existing algorithms while comparable accuracy for the lateral position is achieved. Being able to correct the probe positions has positive implication in experiments, in particular at the short wavelength cases. It relaxes the requirement for the experimental set-up.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection X
EditorsLehmann Peter, Wolfgang Osten, Armando Albertazzi Gocalves
Number of pages7
ISBN (Electronic)9781510611030
Publication statusPublished - 2017
EventOptical Measurement Systems for Industrial Inspection X 2017 - Munich, Germany
Duration: 26 Jun 201729 Jun 2017


ConferenceOptical Measurement Systems for Industrial Inspection X 2017


  • Image reconstruction technique
  • Phase retrieval
  • Ptychography

Fingerprint Dive into the research topics of 'New method for probe position correction for Ptychography'. Together they form a unique fingerprint.

  • Cite this

    Dwivedi, P., Konijnenberg, A. P., Pereira, S. F., & Urbach, H. P. (2017). New method for probe position correction for Ptychography. In L. Peter, W. Osten, & A. Albertazzi Gocalves (Eds.), Optical Measurement Systems for Industrial Inspection X (Vol. 10329). [103292Y] SPIE.