New method of full-field Stress analysis and measurement using photoelasticity

J Dijkstra, W Broere

Research output: Contribution to journal › Article › Scientific › peer-review

9 Citations (Scopus)

Original language	English
Pages (from-to)	1-13
Number of pages	13
Journal	Geotechnical Testing Journal
Volume	33
Issue number	6
DOIs	https://doi.org/10.1520/GTJ102672
Publication status	Published - 2010

Keywords

@article{a88ae4bc9f124977854f3670bbd0e7cf,

title = "New method of full-field Stress analysis and measurement using photoelasticity",

keywords = "CWTS JFIS < 0.75",

author = "J Dijkstra and W Broere",

year = "2010",

doi = "10.1520/GTJ102672",

language = "English",

volume = "33",

pages = "1--13",

journal = "Geotechnical Testing Journal",

issn = "0149-6115",

publisher = "American Society for Testing and Materials",

number = "6",

}