New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

J-D Kamminga, Th.H de Keijser, EJ Mittemeijer, R Delhez

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1059-1066
Number of pages	8
Journal	Journal of Applied Crystallography
Volume	33
Publication status	Published - 2000

ISSN 0021-8898

Keywords

@article{0f8418e73a4c4442a1ff1076fc1f619c,

title = "New methods for diffraction stress measurement: a critical evaluation of new and existing methods.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "J-D Kamminga and {de Keijser}, Th.H and EJ Mittemeijer and R Delhez",

note = "ISSN 0021-8898",

year = "2000",

language = "Undefined/Unknown",

volume = "33",

pages = "1059--1066",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

}

TY - JOUR

T1 - New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

AU - Kamminga, J-D

AU - de Keijser, Th.H

AU - Mittemeijer, EJ

AU - Delhez, R

N1 - ISSN 0021-8898

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0021-8898

VL - 33

SP - 1059

EP - 1066

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -