New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

J-D Kamminga, Th.H de Keijser, EJ Mittemeijer, R Delhez

    Research output: Contribution to journalArticleScientificpeer-review

    39 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)1059-1066
    Number of pages8
    JournalJournal of Applied Crystallography
    Volume33
    Publication statusPublished - 2000

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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