New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

J-D Kamminga, Th.H de Keijser, EJ Mittemeijer, R Delhez

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1059-1066
Number of pages	8
Journal	Journal of Applied Crystallography
Volume	33
Publication status	Published - 2000

ISSN 0021-8898

Keywords

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T1 - New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

AU - Kamminga, J-D

AU - de Keijser, Th.H

AU - Mittemeijer, EJ

AU - Delhez, R

N1 - ISSN 0021-8898

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

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SP - 1059

EP - 1066

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

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