New solid state detector design for ultra sensitive back scattered electron detection

I Gestmann, K Kooijman, A Sakic, LK Nanver, G van Veen

Research output: Contribution to conferencePosterProfessional

Original languageEnglish
Publication statusPublished - 2010
Event17th International Microscopy Congress (IMC17) - Rio de Janeiro, Brazil
Duration: 19 Sep 201024 Sep 2010

Conference

Conference17th International Microscopy Congress (IMC17)
Period19/09/1024/09/10

Keywords

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