New solid state detector design for ultra sensitive back scattered electron detection

I Gestmann, K Kooijman, A Sakic, LK Nanver, G van Veen

Research output: Contribution to conference › Poster › Professional

Original language	English
Publication status	Published - 2010
Event	17th International Microscopy Congress (IMC17) - Rio de Janeiro, Brazil Duration: 19 Sept 2010 → 24 Sept 2010

Conference	17th International Microscopy Congress (IMC17)
Period	19/09/10 → 24/09/10

Keywords

@conference{46b55875112243ddb43c8a497ca9f071,

title = "New solid state detector design for ultra sensitive back scattered electron detection",

keywords = "Geen BTA classificatie",

author = "I Gestmann and K Kooijman and A Sakic and LK Nanver and {van Veen}, G",

year = "2010",

language = "English",

note = "17th International Microscopy Congress (IMC17) ; Conference date: 19-09-2010 Through 24-09-2010",

}

TY - CONF

T1 - New solid state detector design for ultra sensitive back scattered electron detection

AU - Gestmann, I

AU - Kooijman, K

AU - Sakic, A

AU - Nanver, LK

AU - van Veen, G

PY - 2010

Y1 - 2010

KW - Geen BTA classificatie

UR - http://ectm.et.tudelft.nl/V2010_6/html/people_168.html

M3 - Poster

T2 - 17th International Microscopy Congress (IMC17)

Y2 - 19 September 2010 through 24 September 2010

ER -