NoC monitoring: impact on the design flow

C Ciordas, KGW Goossens, T Basten

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

25 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	2006 IEEE International Symposium on Circuits and Systems
Editors	s.n.
Place of Publication	Piscataway-USA
Publisher	IEEE Society
Pages	1981-1984
Number of pages	4
ISBN (Print)	0-7803-9390-2
Publication status	Published - 2006
Event	ISCAS 2006: IEEE International Symposium on Circuits and Systems - Circuits and Systems - Kos International Convention Centre (KICC), Kos, Greece Duration: 21 May 2006 → 24 May 2006

Name
Publisher	IEEE

Keywords

@inproceedings{81677a48dc084a99944841b603bfe93e,

title = "NoC monitoring: impact on the design flow",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "C Ciordas and KGW Goossens and T Basten",

year = "2006",

language = "Undefined/Unknown",

isbn = "0-7803-9390-2",

publisher = "IEEE Society",

pages = "1981--1984",

editor = "s.n.",

booktitle = "2006 IEEE International Symposium on Circuits and Systems",

note = "ISCAS 2006 ; Conference date: 21-05-2006 Through 24-05-2006",

}

TY - GEN

T1 - NoC monitoring: impact on the design flow

AU - Ciordas, C

AU - Goossens, KGW

AU - Basten, T

PY - 2006

Y1 - 2006

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7803-9390-2

SP - 1981

EP - 1984

BT - 2006 IEEE International Symposium on Circuits and Systems

A2 - s.n., null

PB - IEEE Society

CY - Piscataway-USA

T2 - ISCAS 2006

Y2 - 21 May 2006 through 24 May 2006

ER -